This test monitors the I/O operations on each MDisk in each node of the storage system, reports how well every MDisk processes the I/O, and reveals processing latencies (if any) in that MDisk. This way, MDisks that are overloaded, those that are slow in processing I/O, and the nodes that such MDisks are mapped to, can be accurately identified.

The default parameters associated with this test are as follow:

• The TEST PERIOD list box helps the user to decide how often this test needs to be executed.

• In the HOST text box, specify the host for which the test is to be configured.

• Specify the duration (in seconds) beyond which the test will timeout in the TIMEOUT text box. The default value is 30 seconds.

• If multiple components of the same component type are awaiting configuration, then an APPLY TO OTHER COMPONENTS check box will appear in this page. Clicking on this check box will allow you to apply the configuration to all/selected components of that type.

• Once the necessary values have been provided, clicking on the Update button will register the changes made.

When changing the configuration for specific components, a “*” beside the text box corresponding to the parameter signifies that these values have to be manually configured by the user. The parameter values that require to be configured will typically be prefixed with a “$” or contain a series of “*”. A value of "none" in the parameter value indicates that the corresponding parameter value can be changed if required.